ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,406, issued on Sept. 15, was assigned to SEIKO EPSON Corp. (Tokyo). "Carrying case and colorimetric system" was invented by Shigeaki Isobe... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,407, issued on Sept. 15, was assigned to Rosemount Aerospace Inc. (Burnsville, Minn.). "Pyrometers" was invented by Tim Aadland (Lakeville... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,408, issued on Sept. 15, was assigned to VEECO INSTRUMENTS INC. (Plainview, N.Y.). "Lightpipe for high temperature substrate processing" w... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,409, issued on Sept. 15, was assigned to NEC Corp. (Tokyo). "Bolometer-type infrared detector and method of manufacturing the same" was in... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,410, issued on Sept. 15, was assigned to Shenzhen ElinkThings Co. Ltd (Shenzhen, China). "Roasting probe" was invented by Zhen Li (Shenzhe... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,411, issued on Sept. 15, was assigned to Merit Medical Systems Inc. (South Jordan, Utah). "Molded sensor assembly" was invented by Rick Ru... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,413, issued on Sept. 15, was assigned to Analog Devices International UnLtd. Co. (Limerick, Ireland). "Thermal cycle detectors" was invent... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,414, issued on Sept. 15, was assigned to Johnson Matthey Davy Technologies Ltd. (London). "Relating to thermocouples for tubular reactors"... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,415, issued on Sept. 15, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Vacuum sealing integrity of cryogenic electrostati... और पढ़ें
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,416, issued on Sept. 15, was assigned to ZF Friedrichshafen AG (Friedrichshafen, Germany). "Method and device for determining a semiconduc... और पढ़ें